During his career Sal has been involved with nearly all aspects of the semiconductor industry, including R&D, Process and Equipment Engineering, IT and software deployment. Through it he has employed computerized data analysis to transform raw data into usable information to drive process and equipment reliability improvement programs. He has been involved in SEMI Standards, specifically the Metrics TC and the RAMP associated Standards (E10, E58 and E79) sub-committees and task forces. He most recently headed a project at Revasum to gather equipment RAM (E-10) performance data from customers to help identify equipment issues, in order to focus reliability improvement projects.
Keywords: Smart manufacturing, downtime, SEMI E10, reliability
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